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Investigation of interface state density between a-Si:H and insulating layers by ESR and photothermal deflection spectroscopy
Ikurou Umezu, Kazuaki Kitamura, Keiji MaedaVolume:
198-200
Year:
1996
Language:
english
Pages:
782
DOI:
10.1016/0022-3093(96)00011-7
File:
PDF, 295 KB
english, 1996