Atomic force microscopy and scanning tunneling microscopy...

Atomic force microscopy and scanning tunneling microscopy studies on the growth mechanism of a-Si:H film on graphite substrate

Mitsutaka Matsuse, Seiji Tsuboi, Takashi Arakane, Masashi Kawasaki, Hideomi Koinuma
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Volume:
198-200
Year:
1996
Language:
english
Pages:
792
DOI:
10.1016/0022-3093(96)00023-3
File:
PDF, 438 KB
english, 1996
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