![](/img/cover-not-exists.png)
Correlation between structural, optical and electrical properties of μc-Si films
R. Krankenhagen, M. Schmidt, S. Grebner, M. Poschenrieder, W. Henrion, I. Sieber, S. Koynov, R. SchwarzVolume:
198-200
Year:
1996
Language:
english
Pages:
927
DOI:
10.1016/0022-3093(96)00085-3
File:
PDF, 281 KB
english, 1996