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Evaluation of the DICE analysis method for a-Si:H p-i-n devices
W. Gao, C. Main, S. Reynolds, R. Brüggemann, J.H. Zollondz, R.A.G. GibsonVolume:
198-200
Year:
1996
Language:
english
Pages:
1226
DOI:
10.1016/0022-3093(96)00116-0
File:
PDF, 318 KB
english, 1996