International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
2005 Vol. 18; Iss. 4
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A new adaptive multi-bias S-parameter measurement algorithm for transistor characterization
Cornell van Niekerk, Dominique SchreursVolume:
18
Year:
2005
Language:
english
Pages:
15
DOI:
10.1002/jnm.577
File:
PDF, 432 KB
english, 2005