High-resolution and in situ tem studies of annealing of...

High-resolution and in situ tem studies of annealing of Ti-Si multilayers

Karen Holloway, Robert Sinclair
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Volume:
140
Year:
1988
Language:
english
Pages:
149
DOI:
10.1016/0022-5088(88)90376-1
File:
PDF, 895 KB
english, 1988
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