In situ observation by X-ray synchrotron topography of the growth of plastically deformed regions around crack tips in silicon under creep conditions
Gérard Michot, Amand GeorgeVolume:
16
Year:
1982
Language:
english
Pages:
525
DOI:
10.1016/0036-9748(82)90262-9
File:
PDF, 577 KB
english, 1982