Scanning tunnelling microscopy on the 6H SiC(0001) surface
M.A. Kulakov, P. Heuell, V.F. Tsvetkov, B. BullemerVolume:
315
Year:
1994
Language:
english
Pages:
255
DOI:
10.1016/0039-6028(94)90129-5
File:
PDF, 836 KB
english, 1994