In situ monitoring of the c( 4 × 4) to the 2 × 4 surface phase transformation on GaAs(001) by grazing incidence X-ray diffraction
V.H. Etgens, M. Sauvage-Simkin, R. Pinchaux, J. Massies, N. Jedrecy, A. Waldhauer, N. GreiserVolume:
320
Year:
1994
Language:
english
Pages:
259
DOI:
10.1016/0039-6028(94)90313-1
File:
PDF, 656 KB
english, 1994