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Electronic structure and morphology of In-oxide-Si(111) interfaces
H. Öfner, J. Kraft, R. Hofmann, S.L. Surnev, F.P. Netzer, J.J. Paggel, K. HornVolume:
316
Year:
1994
Language:
english
Pages:
123
DOI:
10.1016/0039-6028(94)91133-9
File:
PDF, 973 KB
english, 1994