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Reflection electron microscopy studies of the step meandering and evaporation on vicinal surfaces of silicon
J.M. Bermond, J.J. Métois, J.C. Heyraud, C. AlfonsoVolume:
331-333
Year:
1995
Language:
english
Pages:
865
DOI:
10.1016/0039-6028(95)00127-1
File:
PDF, 1.06 MB
english, 1995