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Inverse photoemission study of non-reconstructed Si(111) surfaces: a comparison between HSi(111) 1 × 1 and As:Si(111) 1 × 1
S. Bouzidi, J.-L. Guyaux, V. Langlais, H. Belkhir, J.-M. Debever, P.A. ThiryVolume:
331-333
Year:
1995
Language:
english
Pages:
1250
DOI:
10.1016/0039-6028(95)00289-8
File:
PDF, 517 KB
english, 1995