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X-ray study of the AgSi(111) interface
R.D. Aburano, Hawoong Hong, J.M. Roesler, D.-S. Lin, T.-C. Chiang, P. ZschackVolume:
339
Year:
1995
Language:
english
Pages:
1
DOI:
10.1016/0039-6028(95)00640-0
File:
PDF, 411 KB
english, 1995