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Strong element dependence of C 1s and Si 2p X-ray photoelectron diffraction profiles for identical C and Si local geometries in β-SiC
S. Juillaguet, L. Kubler, M. Diani, J.L. Bischoff, G. Gewinner, P. Wetzel, N. BécourtVolume:
339
Year:
1995
Language:
english
Pages:
372
DOI:
10.1016/0039-6028(95)00676-1
File:
PDF, 697 KB
english, 1995