Depth profiling of inhomogeneous layers by ellipsometry

Depth profiling of inhomogeneous layers by ellipsometry

D. Tonova, A. Konova
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Volume:
349
Year:
1996
Language:
english
Pages:
229
DOI:
10.1016/0039-6028(95)01063-7
File:
PDF, 545 KB
english, 1996
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