Growth and characterization of the ReSi(111) interface

Surface Science 1996 Vol. 352-354; Iss. none

Growth and characterization of the ReSi(111) interface

A. Siokou, S. Kennou, S. Ladas, T.A. Nguyen Tan, J.-Y. Veuillen
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Volume:
352-354
Year:
1996
Language:
english
Pages:
634
DOI:
10.1016/0039-6028(95)01217-6
File:
PDF, 426 KB
english, 1996
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