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Defect-induced Si(100) dimer buckling structures studied by scanning tunneling microscopy
Michihiro Uchikawa, Masahiko Ishida, Koji Miyake, Kenji Hata, Ryozo Yoshizaki, Hidemi ShigekawaVolume:
357-358
Year:
1996
Language:
english
Pages:
472
DOI:
10.1016/0039-6028(96)00203-8
File:
PDF, 668 KB
english, 1996