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Measurement of the tip-sample capacitance for Si surfaces
Shu Kurokawa, M. Yuasa, Y. Hasegawa, A. SakaiVolume:
357-358
Year:
1996
Language:
english
Pages:
536
DOI:
10.1016/0039-6028(96)00217-8
File:
PDF, 311 KB
english, 1996