Characterization of the poly(para-phenylene...

Characterization of the poly(para-phenylene vinylene)-chromium interface by attenuated total reflection infrared and X-ray emission spectroscopies

T.P. Nguyen, P. Jonnard, F. Vergand, P.F. Staub, J. Thirion, M. Łapkowski, V.H. Tran
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Volume:
75
Year:
1995
Language:
english
Pages:
180
DOI:
10.1016/0379-6779(96)80004-x
File:
PDF, 636 KB
english, 1995
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