Characterization of the poly(para-phenylene vinylene)-chromium interface by attenuated total reflection infrared and X-ray emission spectroscopies
T.P. Nguyen, P. Jonnard, F. Vergand, P.F. Staub, J. Thirion, M. Łapkowski, V.H. TranVolume:
75
Year:
1995
Language:
english
Pages:
180
DOI:
10.1016/0379-6779(96)80004-x
File:
PDF, 636 KB
english, 1995