Analysis of rolling contact fatigued microstructure using...

Analysis of rolling contact fatigued microstructure using focused ion beam sputtering and transmission electron microscopy observation

Akira Muroga, Hiroyasu Saka
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Volume:
33
Year:
1995
Language:
english
Pages:
157
DOI:
10.1016/0956-716x(95)00108-8
File:
PDF, 349 KB
english, 1995
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