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Measurement of the 230U half-life
S. Pommé, T. Altzitzoglou, R. Van Ammel, G. Suliman, M. Marouli, V. Jobbágy, J. Paepen, H. Stroh, C. Apostolidis, K. Abbas, A. MorgensternVolume:
70
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.apradiso.2012.02.053
File:
PDF, 987 KB
english, 2012