Calibration of semiconductor detectors in the...

Calibration of semiconductor detectors in the 200–8500 keV range at VNIIM

Evgeny E. Tereshchenko, Nikolay Moiseev
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Volume:
70
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.apradiso.2012.02.090
File:
PDF, 152 KB
english, 2012
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