Three dimensional imaging using secondary ion mass...

Applied Surface Science 2011 Vol. 258; Iss. 4

Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy

Yves Fleming, Tom Wirtz, Urs Gysin, Thilo Glatzel, Urs Wegmann, Ernst Meyer, Urs Maier, Jörg Rychen
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Volume:
258
Year:
2011
Language:
english
Pages:
1328
DOI:
10.1016/j.apsusc.2011.09.029
File:
PDF, 1.12 MB
english, 2011
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