Modeling validity of femtosecond laser breakdown in wide bandgap dielectrics
Xufeng Jing, Ying Tian, Junchao Zhang, Shunli Chen, Yunxia Jin, Jianda Shao, Zhengxiu FanVolume:
258
Year:
2012
Language:
english
Pages:
4750
DOI:
10.1016/j.apsusc.2012.01.070
File:
PDF, 847 KB
english, 2012