Investigation of the presence of metal droplets after pulsed InN and GaN epitaxial growth using atomic force microscopy and nanoindentation
Penka T. Terziyska, Kenneth Scott Alexander Butcher, Dimiter AlexandrovVolume:
258
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.apsusc.2012.06.062
File:
PDF, 1006 KB
english, 2012