Investigation of the presence of metal droplets after...

Investigation of the presence of metal droplets after pulsed InN and GaN epitaxial growth using atomic force microscopy and nanoindentation

Penka T. Terziyska, Kenneth Scott Alexander Butcher, Dimiter Alexandrov
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Volume:
258
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.apsusc.2012.06.062
File:
PDF, 1006 KB
english, 2012
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