Thickness dependent surface microstructure evolution of bismuth thin film prepared by molecular beam deposition method
Youngkun Ahn, Young-Hwan Kim, Seong-Il Kim, Kwang-Ho JeongVolume:
12
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2012.04.031
File:
PDF, 632 KB
english, 2012