Thickness dependent surface microstructure evolution of...

Thickness dependent surface microstructure evolution of bismuth thin film prepared by molecular beam deposition method

Youngkun Ahn, Young-Hwan Kim, Seong-Il Kim, Kwang-Ho Jeong
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Volume:
12
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2012.04.031
File:
PDF, 632 KB
english, 2012
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