Spectroscopic ellipsometry modeling of ZnO thin films with various O2 partial pressures
Edward Namkyu Cho, Suehye Park, Ilgu YunVolume:
12
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2012.05.030
File:
PDF, 1.03 MB
english, 2012