The probability of pairwise defects creation in 3C–SiC as...

The probability of pairwise defects creation in 3C–SiC as calculated by Xα-DV method

Elmira I. Yuryeva
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Volume:
36
Year:
2006
Language:
english
Pages:
199
DOI:
10.1016/j.commatsci.2005.02.021
File:
PDF, 152 KB
english, 2006
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