Direct sub-nanometer scale electron microscopy analysis of...

Direct sub-nanometer scale electron microscopy analysis of anion incorporation to self-ordered anodic alumina layers

L. González-Rovira, M. López-Haro, A.B. Hungría, K. El Amrani, J.M. Sánchez-Amaya, J.J. Calvino, F.J. Botana
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Volume:
52
Year:
2010
Language:
english
Pages:
3774
DOI:
10.1016/j.corsci.2010.07.027
File:
PDF, 2.84 MB
english, 2010
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