Electrochemical migration of tin in electronics and...

Corrosion Science 2011 Vol. 53; Iss. 5

Electrochemical migration of tin in electronics and microstructure of the dendrites

Daniel Minzari, Flemming Bjerg Grumsen, Morten S. Jellesen, Per Møller, Rajan Ambat
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Volume:
53
Year:
2011
Language:
english
Pages:
1670
DOI:
10.1016/j.corsci.2011.01.009
File:
PDF, 2.29 MB
english, 2011
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