Investigation of Self Interstitial Influences in Light and Dark Induced Degradation in p-type Compensated Silicon
V. Mong-the Yen, D. Barakel, I. Périchaud, O. PalaisVolume:
27
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.egypro.2012.07.032
File:
PDF, 329 KB
english, 2012