Digital mapping of A-horizon thickness using the correlation between various soil properties and soil apparent electrical resistivity
Vincent Chaplot, Simon Lorentz, Pascal Podwojewski, Graham JewittVolume:
157
Year:
2010
Language:
english
DOI:
10.1016/j.geoderma.2010.04.006
File:
PDF, 1.93 MB
english, 2010