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Raman spectral detection and assessment of thin organic layers on metal substrates: systematic approach from substrate preparation to map evaluation
Martin Člupek, Vadym Prokopec, Pavel Matějka, Karel VolkaVolume:
39
Year:
2008
Language:
english
Pages:
10
DOI:
10.1002/jrs.1872
File:
PDF, 584 KB
english, 2008