Raman characterization of the structural evolution in...

Raman characterization of the structural evolution in amorphous and partially nanocrystalline hydrogenated silicon thin films prepared by PECVD

Zhi Li, Wei Li, Yadong Jiang, Haihong Cai, Yuguang Gong, Jian He
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Volume:
42
Year:
2011
Language:
english
Pages:
7
DOI:
10.1002/jrs.2711
File:
PDF, 428 KB
english, 2011
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