Can experts really assess future technology success? A neural network and Bayesian analysis of early stage technology proposals
Craig S. Galbraith, Alex F. DeNoble, Sanford B. Ehrlich, Doug M. KlineVolume:
17
Year:
2007
Language:
english
DOI:
10.1016/j.hitech.2006.11.002
File:
PDF, 197 KB
english, 2007