Image improvement in pinhole SPECT using complete data...

International Congress Series 2004 Vol. 1265; Iss. none

Image improvement in pinhole SPECT using complete data acquisition combined with statistical image reconstruction

Tsutomu Zeniya, Hiroshi Watabe, Toshiyuki Aoi, Kyeong Min Kim, Noboru Teramoto, Takuya Hayashi, Antti Sohlberg, Hiroyuki Kudo, Hidehiro Iida
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Volume:
1265
Year:
2004
Language:
english
DOI:
10.1016/j.ics.2004.04.026
File:
PDF, 289 KB
english, 2004
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