![](/img/cover-not-exists.png)
Nanometric multilayers: A new approach for joining TiAl
A.S. Ramos, M.T. Vieira, L.I. Duarte, M.F. Vieira, F. Viana, R. CalinasVolume:
14
Year:
2006
Language:
english
DOI:
10.1016/j.intermet.2005.12.012
File:
PDF, 452 KB
english, 2006