Nanometric multilayers: A new approach for joining TiAl

Nanometric multilayers: A new approach for joining TiAl

A.S. Ramos, M.T. Vieira, L.I. Duarte, M.F. Vieira, F. Viana, R. Calinas
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Volume:
14
Year:
2006
Language:
english
DOI:
10.1016/j.intermet.2005.12.012
File:
PDF, 452 KB
english, 2006
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