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Resonant X-ray diffraction of α-phase Mo0.15Ru0.85Si and crystal stability calculation in Mo–Ru–Si system (FeSi and CsCl types)
Ferhath Zamoum, Michel François, Janusz Tobola, Eric Elkaim, Michel VilasiVolume:
16
Year:
2008
Language:
english
DOI:
10.1016/j.intermet.2008.04.011
File:
PDF, 668 KB
english, 2008