Resonant X-ray diffraction study and electronic structure...

Intermetallics 2010 Vol. 18; Iss. 5

Resonant X-ray diffraction study and electronic structure calculations of three Mo–Ru–Si ternary phases

Janusz Tobola, Michel François, Eric Elkaim, Jean-Marc Joubert, Michel Vilasi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
18
Year:
2010
Language:
english
DOI:
10.1016/j.intermet.2009.12.009
File:
PDF, 918 KB
english, 2010
Conversion to is in progress
Conversion to is failed