Crystal growth, microhardness and oxidation behavior of RMn2Si2 compounds (R = La, Ce, Pr, Nd, Sm, Gd)
Shigeru Okada, Kiyokata Iizumi, Takao Mori, Toetsu Shishido, Kunio Kudou, Takaho Tanaka, Peter Rogl, Torsten LundströmVolume:
383
Year:
2004
Language:
english
DOI:
10.1016/j.jallcom.2004.04.038
File:
PDF, 242 KB
english, 2004