Electron backscatter diffraction as a useful method for...

Electron backscatter diffraction as a useful method for alloys microstructure characterization

Leszek Klimek, Bożena Pietrzyk
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Volume:
382
Year:
2004
Language:
english
DOI:
10.1016/j.jallcom.2004.06.012
File:
PDF, 739 KB
english, 2004
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