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Investigation of the defects distribution along the growth direction in GdCOB crystals by synchrotron and conventional X-ray topography
W. Wierzchowski, K. Wieteska, W. Graeff, E. Wierzbicka, M. Lefeld-Sosnowska, A. KłosVolume:
401
Year:
2005
Language:
english
DOI:
10.1016/j.jallcom.2005.03.084
File:
PDF, 478 KB
english, 2005