Fatigue behavior of nano-grained copper prepared by ECAP
Seung Zeon Han, Masahiro Goto, Chayong Lim, Chang Joo Kim, Sangshik KimVolume:
434-435
Year:
2007
Language:
english
DOI:
10.1016/j.jallcom.2006.08.179
File:
PDF, 416 KB
english, 2007