Thermal stability of GaN powders investigated by XRD, XPS,...

Thermal stability of GaN powders investigated by XRD, XPS, PL, TEM, and FT-IR

Hongdi Xiao, Rong Liu, Honglei Ma, Zhaojun Lin, Jin Ma, Fujian Zong, Liangmo Mei
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Volume:
465
Year:
2008
Language:
english
DOI:
10.1016/j.jallcom.2007.10.084
File:
PDF, 487 KB
english, 2008
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