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Determination of grain size by XRD profile analysis and TEM counting in nano-structured Cu
Yong Zhong, Dehai Ping, Xiaoyan Song, Fuxing YinVolume:
476
Year:
2009
Language:
english
DOI:
10.1016/j.jallcom.2008.08.075
File:
PDF, 600 KB
english, 2009