RBS spectrometric studies on the interdiffusion profile of...

RBS spectrometric studies on the interdiffusion profile of multilayer thin film structure to yield Cd1−xMnxTe alloy

Pushan Banerjee, Biswajit Ghosh
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Volume:
484
Year:
2009
Language:
english
DOI:
10.1016/j.jallcom.2009.05.024
File:
PDF, 1.31 MB
english, 2009
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