Characterization and reliability study of low temperature...

Characterization and reliability study of low temperature hermetic wafer level bonding using In/Sn interlayer and Cu/Ni/Au metallization

Da-Quan Yu, Chengkuo Lee, Li Ling Yan, Meei Ling Thew, John H. Lau
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Volume:
485
Year:
2009
Language:
english
DOI:
10.1016/j.jallcom.2009.05.136
File:
PDF, 1.37 MB
english, 2009
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