Characterization of native oxide film on amorphous Co66Si16B12Fe4Mo2 by X-ray photoelectron spectroscopy
Rohit Jain, Deepika Bhandari, Anil Dhawan, S.K. SharmaVolume:
490
Year:
2010
Language:
english
DOI:
10.1016/j.jallcom.2009.10.119
File:
PDF, 216 KB
english, 2010