Characterization of native oxide film on amorphous...

Characterization of native oxide film on amorphous Co66Si16B12Fe4Mo2 by X-ray photoelectron spectroscopy

Rohit Jain, Deepika Bhandari, Anil Dhawan, S.K. Sharma
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Volume:
490
Year:
2010
Language:
english
DOI:
10.1016/j.jallcom.2009.10.119
File:
PDF, 216 KB
english, 2010
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