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The analysis of the charge transport mechanism of n-Si/MEH-PPV device structure using forward bias I–V–T characteristics
A. Sertap Kavasoglu, Fahrettin Yakuphanoglu, Nese Kavasoglu, Osman Pakma, Ozcan Birgi, Sener OktikVolume:
492
Year:
2010
Language:
english
DOI:
10.1016/j.jallcom.2009.11.128
File:
PDF, 862 KB
english, 2010