Structural and dielectric properties of Bi2Zn2/3Nb4/3O7 thin films prepared by pulsed laser deposition at low temperature for embedded capacitor applications
Xiaohua Zhang, Wei Ren, Peng Shi, M. Saeed Khan, Xiaofeng Chen, Xiaoqing Wu, Xi YaoVolume:
509
Year:
2011
Language:
english
DOI:
10.1016/j.jallcom.2011.06.120
File:
PDF, 1013 KB
english, 2011